2001 volume 33(1)
doi:10.1068/htwu329

Cite as:
Mehling H, Kuhn J, Manara J, Brandt R, Fricke J, 2001, "Different methods for determining the refractive index of SiO2 glass in the range 1.4 - 50μm" High Temperatures - High Pressures 33(1) 35 – 42

Different methods for determining the refractive index of SiO2 glass in the range 1.4 - 50μm

Harald Mehling, Joachim Kuhn, Jochen Manara, Rainer Brandt, Jochen Fricke

Received 20 December 1999

Abstract. The refractive index n - ik is the key optical property for calculating the radiative and combined radiative - conductive heat transfer in scattering as well as in nonscattering media. Both n and k can vary over several orders of magnitude in the important spectral range from the near to the mid infrared. Different methods to determine the refractive index on nonscattering samples with specular reflecting surfaces exist, but each of them is only applicable under limited conditions with respect to spectral range and sample thickness. In this work, these limitations are identified and discussed. Experimental and evaluation techniques are improved, where possible. The determination of the refractive index of SiO2 glass in the 1.4 to 50 μm range was performed as a case study. The resulting data for the refractive index determined by different methods in our laboratories are presented and compared with each other as well as with literature data. Excellent agreement between data from different methods is found in those spectral regions where these methods are applicable.

Restricted material:

PDF Full-text PDF size: 360 Kb

Your computer (IP address: 38.107.191.81) has not been recognised as being on a network authorised to view the full text or references of this article. Please contact your serials librarian (subscriptions information).